68.37.-d Microscopy of surfaces, interfaces, and thin films ( 1 Dok. )

• 68.37.Ef Scanning tunneling microscopy (including chemistry induced with STM) ( 0 Dok. )
• 68.37.Hk Scanning electron microscopy (SEM) (including EBIC) ( 1 Dok. )
• 68.37.Lp Transmission electron microscopy (TEM) (including STEM, HRTEM, etc.) ( 0 Dok. )
• 68.37.Nq Low energy electron microscopy (LEEM) ( 0 Dok. )
• 68.37.Ps Atomic force microscopy (AFM) ( 1 Dok. )
• 68.37.Rt Magnetic force microscopy (MFM) ( 0 Dok. )
• 68.37.Tj Acoustic force microscopy ( 0 Dok. )
• 68.37.Uv Near-field scanning microscopy and spectroscopy ( 0 Dok. )
• 68.37.Vj Field emission and field-ion microscopy ( 0 Dok. )
• 68.37.Xy Scanning Auger microscopy, photoelectron microscopy ( 0 Dok. )
• 68.37.Yz X-ray microscopy ( 0 Dok. )

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Letzte Änderung: 14.07.10